抗错误性增强现实应用的低压SRAM评估

Tony F. Wu, Doyun Kim, D. Morris, E. Beigné
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引用次数: 0

摘要

增强现实(AR)旨在实现需要高性能,同时在全天可穿戴,小尺寸设备上消耗低功耗的应用。幸运的是,许多AR应用程序(如神经网络)具有容错性(即,计算或内存中的错误结果相同),这为在硬件中实现其构建块时利用低功耗电路技术提供了机会。许多这样的神经网络需要大量使用片上存储器,如SRAM(硬件加速器的主要构建块)来存储权重。这项工作表明,通过将这些sram的供电电压降低到额定电压以上(从而引入误差),可以节省高达30%的动态能量和30%的泄漏能量,而不会对神经网络精度造成可测量的损失。额外的节能机会(高达6%)可以通过电路修改来捕获,以塑造sram在低电压下的错误概率,并逐步训练神经网络。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality Applications
Augmented reality (AR) aims to implement applications, requiring high performance, while consuming low power on an all-day wearable, small form-factor, device. Luckily, many AR applications such as neural networks are error-resilient (i.e., results are same with errors in computation or memory), providing an opportunity to utilize low-power circuit techniques when implementing their building blocks in hardware. Many of these neural networks require significant use of on-chip memory such as SRAM (a major building block in hardware accelerators) for weight storage. This work shows that up to 30% dynamic energy and 30% leakage energy savings can be achieved by reducing the supply voltage of these SRAMs beyond rated voltages (thus, introducing errors), without measurable loss in neural network accuracy. Additional energy saving opportunities (up to 6%) can be captured by circuit modifications to shape the error probabilities of SRAMs at low voltages and incrementally training the neural networks.
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