{"title":"CVS奇偶树的故障检测:在SSC CVS奇偶校验和双轨校验中的应用","authors":"N. Jha","doi":"10.1109/FTCS.1989.105603","DOIUrl":null,"url":null,"abstract":"The problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. CVS circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. If the CVS parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates, then it is shown that at most only five tests are needed for detecting all single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, than the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate. For such a tree it is shown that only eight tests are enough. For a strongly self-checking (SSC) CVS parity checker the number of required tests is nine, whereas for an SSC CVS two-rail checker the size of the test set is at most five.<<ETX>>","PeriodicalId":230363,"journal":{"name":"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Fault detection in CVS parity trees: application in SSC CVS parity and two-rail checkers\",\"authors\":\"N. Jha\",\"doi\":\"10.1109/FTCS.1989.105603\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. CVS circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. If the CVS parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates, then it is shown that at most only five tests are needed for detecting all single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, than the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate. For such a tree it is shown that only eight tests are enough. For a strongly self-checking (SSC) CVS parity checker the number of required tests is nine, whereas for an SSC CVS two-rail checker the size of the test set is at most five.<<ETX>>\",\"PeriodicalId\":230363,\"journal\":{\"name\":\"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FTCS.1989.105603\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1989.105603","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault detection in CVS parity trees: application in SSC CVS parity and two-rail checkers
The problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. CVS circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. If the CVS parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates, then it is shown that at most only five tests are needed for detecting all single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, than the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate. For such a tree it is shown that only eight tests are enough. For a strongly self-checking (SSC) CVS parity checker the number of required tests is nine, whereas for an SSC CVS two-rail checker the size of the test set is at most five.<>
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