电源设计的性能和可靠性

Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093) Pub Date : 2000-10-10 DOI:10.1109/NAECON.2000.894956

K. Shenai, P. Singh, S. Rao, D. Sorenson, K. Chu, G. Gaylon

{"title":"电源设计的性能和可靠性","authors":"K. Shenai, P. Singh, S. Rao, D. Sorenson, K. Chu, G. Gaylon","doi":"10.1109/NAECON.2000.894956","DOIUrl":null,"url":null,"abstract":"This paper presents the results obtained from a study conducted to evaluate the long-term operational reliability of dc-dc power converters used in computer and telecom applications. A full-bridge, phase-shifted zero voltage switching (ZVS) PWM converter was investigated experimentally and theoretically it is shown that under low-load conditions, the intrinsic body diode of the MOSFET undergoes dynamic avalanching during its reverse recovery with an associated high dv/dt. This phenomenon results in an excessive power loss in the circuit and increased switching stress for the MOSFET. The converter failure under low-load conditions can be associated with this mechanism as one of the potential causes. The paper also presents experimental results obtained on dc-dc power converter prototypes smeared with zinc whiskers. It is shown that power supply arcing under these conditions is a potential cause of failure.","PeriodicalId":171131,"journal":{"name":"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Power supply design for performance and reliability\",\"authors\":\"K. Shenai, P. Singh, S. Rao, D. Sorenson, K. Chu, G. Gaylon\",\"doi\":\"10.1109/NAECON.2000.894956\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the results obtained from a study conducted to evaluate the long-term operational reliability of dc-dc power converters used in computer and telecom applications. A full-bridge, phase-shifted zero voltage switching (ZVS) PWM converter was investigated experimentally and theoretically it is shown that under low-load conditions, the intrinsic body diode of the MOSFET undergoes dynamic avalanching during its reverse recovery with an associated high dv/dt. This phenomenon results in an excessive power loss in the circuit and increased switching stress for the MOSFET. The converter failure under low-load conditions can be associated with this mechanism as one of the potential causes. The paper also presents experimental results obtained on dc-dc power converter prototypes smeared with zinc whiskers. It is shown that power supply arcing under these conditions is a potential cause of failure.\",\"PeriodicalId\":171131,\"journal\":{\"name\":\"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NAECON.2000.894956\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.2000.894956","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 9

摘要

本文介绍了一项评估计算机和电信应用中使用的dc-dc电源变换器长期运行可靠性的研究结果。对全桥移相零电压开关(ZVS) PWM变换器进行了实验和理论研究，结果表明，在低负载条件下，MOSFET的本禀体二极管在反向恢复过程中会发生动态雪崩，并伴有较高的dv/dt。这种现象导致电路中功率损耗过大，并增加了MOSFET的开关应力。低负荷条件下的变流器故障可能与此机制有关，是潜在的原因之一。本文还介绍了涂锌晶须的直流-直流功率变换器样机的实验结果。结果表明，在这种情况下，电源电弧是导致故障的潜在原因。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Power supply design for performance and reliability

This paper presents the results obtained from a study conducted to evaluate the long-term operational reliability of dc-dc power converters used in computer and telecom applications. A full-bridge, phase-shifted zero voltage switching (ZVS) PWM converter was investigated experimentally and theoretically it is shown that under low-load conditions, the intrinsic body diode of the MOSFET undergoes dynamic avalanching during its reverse recovery with an associated high dv/dt. This phenomenon results in an excessive power loss in the circuit and increased switching stress for the MOSFET. The converter failure under low-load conditions can be associated with this mechanism as one of the potential causes. The paper also presents experimental results obtained on dc-dc power converter prototypes smeared with zinc whiskers. It is shown that power supply arcing under these conditions is a potential cause of failure.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093)

自引率

0.00%

发文量