可靠驱动GaN器件的挑战

Paul Brohlin
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引用次数: 2

摘要

GaN的低损耗、低交叉损耗和缺乏反向恢复的特性使其成为比硅更有效的功率开关。这些特性使得图腾极无桥功率因数转换器(PFC)等高频硬开关拓扑成为可能,而硅mosfet和绝缘栅双极晶体管(igbt)由于其高开关损耗而无法实现这些拓扑。为了利用这些特性,氮化镓必须快速可靠地切换。本文研究了驱动、封装和GaN HEMT的要求,以实现高效可靠的切换。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Challenges in reliably driving GaN devices
GaN's properties of low Coss, Crss, and lack of reverse recovery make it a more efficient power switch versus silicon. These characteristics enable higher-frequency hard-switched topologies such as totem-pole bridgeless power factor converter (PFC) that cannot be realized by silicon MOSFETs and insulated-gate bipolar transistors (IGBTs) due to their high switching losses. To take advantages of these properties, GaN must be switched quickly and reliably. This paper examines requirements for the driver, package, and the GaN HEMT to enable efficient and reliable switching.
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