IEEE P1581兼容设备的测试模式进入和退出方法

2009 International Test Conference Pub Date : 2009-12-18 DOI:10.1109/TEST.2009.5355636

H. Ehrenberg

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引用次数: 1

摘要

IEEE P1581针对的是由于任何原因而没有提供用于测试的设计(DFT)的ic，主要针对存储设备，但也允许在其他设备中实现。这张海报概述了IEEE P1581中提出的测试模式进入和退出方法。

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Test Mode Entry and Exit Methods for IEEE P1581 compliant devices

IEEE P1581 is aimed at ICs that are otherwise not provisioned with Design For Test (DFT) for any reason, targeting primarily memory devices, but also allowing for implementation in other devices. This Poster provides an overview of Test Mode Entry and Exit Methods proposed in IEEE P1581.

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来源期刊

2009 International Test Conference

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