{"title":"有界方差下误差传播概率的估计","authors":"H. Asadi, M. Tahoori, C. Tirumurti","doi":"10.1109/DFT.2007.51","DOIUrl":null,"url":null,"abstract":"Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system and cost-effective reliability improvements. In this paper we present an approach to obtain uncertainty bounds on the error propagation probability (EPP) values used in SER estimation based on an analytical approach. We demonstrate how we can compute EPP values and their uncertainty bounds (variances) by examining the logic gates in a topological order. Comparison of this method with the Monte-Carlo (MC) fault simulation approach confirms the accuracy of the presented technique for both the computed EPP values and uncertainty bounds. Also, this technique is 3-5 orders of magnitude faster than fault simulation.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Estimating Error Propagation Probabilities with Bounded Variances\",\"authors\":\"H. Asadi, M. Tahoori, C. Tirumurti\",\"doi\":\"10.1109/DFT.2007.51\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system and cost-effective reliability improvements. In this paper we present an approach to obtain uncertainty bounds on the error propagation probability (EPP) values used in SER estimation based on an analytical approach. We demonstrate how we can compute EPP values and their uncertainty bounds (variances) by examining the logic gates in a topological order. Comparison of this method with the Monte-Carlo (MC) fault simulation approach confirms the accuracy of the presented technique for both the computed EPP values and uncertainty bounds. Also, this technique is 3-5 orders of magnitude faster than fault simulation.\",\"PeriodicalId\":259700,\"journal\":{\"name\":\"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2007.51\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2007.51","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Estimating Error Propagation Probabilities with Bounded Variances
Fast and accurate estimation of soft error rate (SER) is essential in obtaining the reliability parameters of a digital system and cost-effective reliability improvements. In this paper we present an approach to obtain uncertainty bounds on the error propagation probability (EPP) values used in SER estimation based on an analytical approach. We demonstrate how we can compute EPP values and their uncertainty bounds (variances) by examining the logic gates in a topological order. Comparison of this method with the Monte-Carlo (MC) fault simulation approach confirms the accuracy of the presented technique for both the computed EPP values and uncertainty bounds. Also, this technique is 3-5 orders of magnitude faster than fault simulation.