一种用腔微扰法测量介质损耗样品介电常数的简单方法

2007 IEEE Applied Electromagnetics Conference (AEMC) Pub Date : 2007-12-01 DOI:10.1109/AEMC.2007.4638036

P. Banerjee, G. Ghosh, S. K. Biswas

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引用次数: 2

摘要

空腔摄动法广泛应用于介电材料在x波段的电磁特性研究。它适用于低损耗和中损耗材料的测量。本文讨论了一种简便、可靠的测定聚四氟乙烯和有机玻璃等介质损耗样品介电常数的方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A simple technique for the measurement of the permittivity of medium loss samples using cavity perturbation method

The cavity perturbation method is widely used in the study of electromagnetic properties of dielectric materials at X-band frequencies. It works well for the measurement of low-loss and medium loss materials. In this paper an easy and reliable method is discussed for the accurate determination of the dielectric constant of medium loss samples such as Teflon and Perspex.

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2007 IEEE Applied Electromagnetics Conference (AEMC)

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