基于时间超过阈值的芯片测试系统优化了线性传输特性和低功耗的粒子跟踪应用

K. Kasinski, R. Kleczek
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引用次数: 0

摘要

本文介绍了用于测试DSToTIC3 ASIC的电路和系统。本文还将详细研究在真实外部分量存在下的估计噪声性能。DSToTIC3是一种原型,8通道前端电子设备,专为长硅带传感器和新型跟踪探测器的互连而设计。给出了模具的布局和总体结构。内置数模转换器最大限度地减少了芯片操作所需的外部组件数量,这使得它很容易扩展到最终的多通道设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Test system of the time-over-threshold based chip optimized for linear transfer characteristics and low power for particle tracking applications
This paper presents the circuits and systems developed for testing the DSToTIC3 ASIC. Detailed study of the estimated noise performance in the presence of realistic external components is also a subject of this paper. DSToTIC3 is a prototype, 8-channel front-end electronics designed for the regime of long silicon strip sensors and interconnects of new tracking detectors. Layout and general architecture of the die is presented. Built-in digital-to-analog converters minimize the number of external components required for the chip operation, which makes it easily scalable to a final multichannel design.
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