{"title":"微波双端口器件特性的微带槽线","authors":"J. Quine, J. Mcmullen, N. T. Lavoo","doi":"10.1109/EIC.1977.7461908","DOIUrl":null,"url":null,"abstract":"The electrical and mechanical design of a micro-strip slotted line will be described. By means of this line, large-signal input and output impedances, gain and conversion efficiency of two-port bipolar transistor, FET and CATT devices can be measured as a function of frequency and power level. Measurements with the new microstrip slotted line can be performed much more quickly and accurately than with the conventional method.","PeriodicalId":214025,"journal":{"name":"1977 EIC 13th Electrical/Electronics Insulation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1977-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A microstrip slotted line for microwave two-port device characterization\",\"authors\":\"J. Quine, J. Mcmullen, N. T. Lavoo\",\"doi\":\"10.1109/EIC.1977.7461908\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The electrical and mechanical design of a micro-strip slotted line will be described. By means of this line, large-signal input and output impedances, gain and conversion efficiency of two-port bipolar transistor, FET and CATT devices can be measured as a function of frequency and power level. Measurements with the new microstrip slotted line can be performed much more quickly and accurately than with the conventional method.\",\"PeriodicalId\":214025,\"journal\":{\"name\":\"1977 EIC 13th Electrical/Electronics Insulation Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1977-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1977 EIC 13th Electrical/Electronics Insulation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIC.1977.7461908\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1977 EIC 13th Electrical/Electronics Insulation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIC.1977.7461908","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A microstrip slotted line for microwave two-port device characterization
The electrical and mechanical design of a micro-strip slotted line will be described. By means of this line, large-signal input and output impedances, gain and conversion efficiency of two-port bipolar transistor, FET and CATT devices can be measured as a function of frequency and power level. Measurements with the new microstrip slotted line can be performed much more quickly and accurately than with the conventional method.
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