用同轴电缆法研究硼浮石33和一些经典玻璃的介电特性

Abdoulaye Sissoko, A. Chousseaud, T. Razban, B. Diourte
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引用次数: 0

摘要

在这项研究中,我们通过基于s参数的宽带表征方法对硼浮33玻璃和其他更便宜的传统玻璃的固体金属化进行了技术鉴定。这使得提取设计和建造低视觉冲击天线所需的电磁参数(介电常数,正切损耗)成为可能。对这些测量结果的数据进行了处理。然后提取S11、S33、S12、S34的值。损耗正切和介电常数的值就这样测量出来了。得到经典玻璃εr = 6.5, tanδ = 0.0206;显微镜玻璃εr = 6.15, tanδ = 0.021,硼浮子玻璃εr = 3.9, tanδ = 0.012。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Dielectric characterization of Borofloat 33 and some classic glasses by the coaxial cable method
In this study, we made the technical qualification of borofloat 33 glass and also other much cheaper conventional glasses, associated with solid metallization by a broadband characterization method based on the S-parameters. This made it possible to extract the electromagnetic parameters (dielectric permittivity, tangent loss) necessary for the design and construction of low visual impact antennas. The data of these measurement results are processed. The values of S11, S33, S12, and S34 are then extracted. The values of the loss tangent and the dielectric constant are thus measured. We have obtained for the classical glass εr = 6.5 and tanδ = 0.0206; for the microscope glass εr = 6.15 and tanδ = 0.021 and at the end for the Borofloat glass εr = 3.9 and tanδ = 0.012.
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