{"title":"线性反馈信号寄存器混叠概率的迭代计算方法","authors":"A. Ivanov, V. Agarwal","doi":"10.1109/FTCS.1988.5299","DOIUrl":null,"url":null,"abstract":"An iterative technique for computing the exact probability of aliasing for any linear feedback signature register (i.e. characterized by any feedback polynomial, for any constant probability of error, and for any test length) is proposed. The technique is also applicable to a more general model of the aliasing problem wherein the probability of error may vary with each output bit. The complexity of the technique enables registers of lengths of interest in practice, e.g. 16, to be analyzed readily.<<ETX>>","PeriodicalId":171148,"journal":{"name":"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"45","resultStr":"{\"title\":\"An iterative technique for calculating aliasing probability of linear feedback signature registers\",\"authors\":\"A. Ivanov, V. Agarwal\",\"doi\":\"10.1109/FTCS.1988.5299\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An iterative technique for computing the exact probability of aliasing for any linear feedback signature register (i.e. characterized by any feedback polynomial, for any constant probability of error, and for any test length) is proposed. The technique is also applicable to a more general model of the aliasing problem wherein the probability of error may vary with each output bit. The complexity of the technique enables registers of lengths of interest in practice, e.g. 16, to be analyzed readily.<<ETX>>\",\"PeriodicalId\":171148,\"journal\":{\"name\":\"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"45\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FTCS.1988.5299\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1988.5299","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An iterative technique for calculating aliasing probability of linear feedback signature registers
An iterative technique for computing the exact probability of aliasing for any linear feedback signature register (i.e. characterized by any feedback polynomial, for any constant probability of error, and for any test length) is proposed. The technique is also applicable to a more general model of the aliasing problem wherein the probability of error may vary with each output bit. The complexity of the technique enables registers of lengths of interest in practice, e.g. 16, to be analyzed readily.<>