大型软件系统的缺陷预测——从缺陷密度到机器学习

Satyabrata Pradhan, Venky Nanniyur, Pavan K. Vissapragada
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引用次数: 5

摘要

随着软件行业向软件即服务(SAAS)模式的转变,公司面临着巨大的竞争压力,需要以比以前更快的速度改进软件质量。软件缺陷预测(SDP)通过在整个软件开发生命周期(SDLC)中实现预测性质量管理,在此工作中扮演了重要的角色。SDP传统上使用缺陷密度和其他参数模型。然而,机器学习和人工智能(ML/AI)的最新进展使学术研究人员和行业从业者对基于ML的缺陷预测产生了新的兴趣。已发表的关于该主题的研究主要集中在两个领域,即模型属性和ML算法,以开发中小型软件(主要是开源)的SDP模型。然而,正如我们在本文中提出的那样,对于具有数亿行代码(LOC)的大型软件来说,基于ml的SDP需要解决称为“数据定义”和“SDP生命周期”的其他领域的挑战。我们针对这些挑战提出了解决方案,并以思科系统开发的大型软件(IOS-XE)为例,展示了我们解决方案的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the Defect Prediction for Large Scale Software Systems – From Defect Density to Machine Learning
As the software industry transitions to software-as-a-service (SAAS) model, there has been tremendous competitive pressure on companies to improve software quality at a much faster rate than before. The software defect prediction (SDP) plays an important role in this effort by enabling predictive quality management during the entire software development lifecycle (SDLC). The SDP has traditionally used defect density and other parametric models. However, recent advances in machine learning and artificial intelligence (ML/AI) have created a renewed interest in ML-based defect prediction among academic researchers and industry practitioners. Published studies on this subject have focused on two areas, i.e. model attributes and ML algorithms, to develop SDP models for small to medium sized software (mostly opensource). However, as we present in this paper, ML-based SDP for large scale software with hundreds of millions of lines of code (LOC) needs to address challenges in additional areas called "Data Definition" and "SDP Lifecycle." We have proposed solutions for these challenges and used the example of a large-scale software (IOS-XE) developed by Cisco Systems to show the validity of our solutions.
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