{"title":"并行可测试微程序控制单元的设计","authors":"M. Namjoo","doi":"10.1145/1014194.800947","DOIUrl":null,"url":null,"abstract":"Four schemes for the design of concurrently testable microprogrammed control units are presented. In Schemes 1 and 2 the concept of path signatures is used for detection of malfunctions in the control unit. Two different methods for computation of signatures are given. In Schemes 3 and 4, a check-symbol is assigned to each microinstruction and the integrity of these check-symbols is checked concurrently. A deterministic approach is used for generation of check-symbols in Scheme 4. A comparative study of these schemes is done with respect to storage and time overhead, error coverage, and implementation complexity.","PeriodicalId":134922,"journal":{"name":"MICRO 15","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Design of concurrently testable microprogrammed control units\",\"authors\":\"M. Namjoo\",\"doi\":\"10.1145/1014194.800947\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Four schemes for the design of concurrently testable microprogrammed control units are presented. In Schemes 1 and 2 the concept of path signatures is used for detection of malfunctions in the control unit. Two different methods for computation of signatures are given. In Schemes 3 and 4, a check-symbol is assigned to each microinstruction and the integrity of these check-symbols is checked concurrently. A deterministic approach is used for generation of check-symbols in Scheme 4. A comparative study of these schemes is done with respect to storage and time overhead, error coverage, and implementation complexity.\",\"PeriodicalId\":134922,\"journal\":{\"name\":\"MICRO 15\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-10-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"MICRO 15\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1014194.800947\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"MICRO 15","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1014194.800947","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of concurrently testable microprogrammed control units
Four schemes for the design of concurrently testable microprogrammed control units are presented. In Schemes 1 and 2 the concept of path signatures is used for detection of malfunctions in the control unit. Two different methods for computation of signatures are given. In Schemes 3 and 4, a check-symbol is assigned to each microinstruction and the integrity of these check-symbols is checked concurrently. A deterministic approach is used for generation of check-symbols in Scheme 4. A comparative study of these schemes is done with respect to storage and time overhead, error coverage, and implementation complexity.
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