影响薄膜沉积的几个溅射参数

Haroon Ejaz, Shabbir Hussain, Manzar Zahra, Qaisar Mehmood Saharan, Salman Ashiq
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引用次数: 0

摘要

几个世纪以来,溅射是一种在不同基底上沉积薄膜的技术。在这种技术中,源原子或电子被轰击在靶材料上,靶材料溅射出靶金属原子。发射的靶原子以薄膜的形式沉积在衬底上。几个溅射参数控制薄膜沉积的速率。这些溅射参数包括施加的电压、溅射产量、使用的气体类型、使用的目标材料类型、要沉积薄膜的衬底类型、系统的工作压力、功率、系统和衬底的温度、轰击入射角以及目标和衬底之间的距离。这些参数对于薄膜的厚度和性能是必不可少的。这些性质包括电学性质、热性质、光学性质和化学性质。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SEVERAL SPUTTERING PARAMETERS AFFECTING THIN FILM DEPOSITION
Sputtering is a technique used for thin film deposition on different substrates for centuries. In this technique, the source atoms or electrons are bombarded on the target material that sputters target metal atoms. The emitted target atoms are deposited on the substrate in the form of thin films. Several sputtering parameters control the rate at which films are deposited. These sputtering parameters include voltage applied, sputter yield, type of the gas used, type of the target material used, type of the substrate on which the thin films are to be deposited, the working pressure of the system, power, temperature of the system and substrate, angle of incidence of bombardment and distance between target and substrate. These parameters are essential to have thin films of desired thickness and properties. These properties include electrical properties, thermal properties, optical properties and chemical properties as well.
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