High-Performance SET Hardening Technique for Vision-Oriented Applications

The decreasing feature size of VLSI circuits has led to a rise in Single Event Transients (SETs), making them the dominant cause of errors in modern VLSI devices, especially Flash-based FPGAs. The combinational logic in these devices is particularly vulnerable to SETs, making efficient SET hardening techniques essential. Given the demanding performance requirements for vision-oriented benchmarks, finding an efficient hardening technique that does not exceed area and performance limitations is challenging. This paper presents a SET hardening workflow based on an accurate SET analysis aimed at identifying vulnerable circuit nodes for selectively applying hardening techniques to Microchip RTG4 radiation-hardened Flash-based FPGAs. Results from experiments comparing plain, Global hardening, and proposed selective hardening techniques show the high efficiency of the proposed solution.