非侵入性板测试(NBT)的缺陷覆盖率:当非侵入性板测试通过时意味着什么?

Adam W. Ley
{"title":"非侵入性板测试(NBT)的缺陷覆盖率:当非侵入性板测试通过时意味着什么?","authors":"Adam W. Ley","doi":"10.1109/TEST.2009.5355828","DOIUrl":null,"url":null,"abstract":"Non-intrusive board test (NBT) [1] is an emerging test methodology that integrates several complementary test technologies to restore test coverage lost due to diminishing physical (probe) access to printed circuit boards. While NBT boundary-scan test provides a core capability for structural test (e.g., shorts & opens), NBT processor-controlled test adds an element of functional test (e.g., at-speed operation) and NBT built-in self test delivers performance test (e.g., on-margin operation). A framework to consider the overall test coverage in these multiple dimensions is required to assess the full impact of the test strategy.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?\",\"authors\":\"Adam W. Ley\",\"doi\":\"10.1109/TEST.2009.5355828\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Non-intrusive board test (NBT) [1] is an emerging test methodology that integrates several complementary test technologies to restore test coverage lost due to diminishing physical (probe) access to printed circuit boards. While NBT boundary-scan test provides a core capability for structural test (e.g., shorts & opens), NBT processor-controlled test adds an element of functional test (e.g., at-speed operation) and NBT built-in self test delivers performance test (e.g., on-margin operation). A framework to consider the overall test coverage in these multiple dimensions is required to assess the full impact of the test strategy.\",\"PeriodicalId\":419063,\"journal\":{\"name\":\"2009 International Test Conference\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2009.5355828\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355828","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

非侵入式电路板测试(NBT)[1]是一种新兴的测试方法,它集成了几种互补的测试技术,以恢复由于减少对印刷电路板的物理(探针)访问而丢失的测试覆盖率。NBT边界扫描测试提供了结构测试的核心能力(例如,短路和打开),NBT处理器控制测试增加了功能测试的元素(例如,高速运行),NBT内置自检提供了性能测试(例如,边际运行)。需要一个框架来考虑这些多维度中的总体测试覆盖率,以评估测试策略的全部影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?
Non-intrusive board test (NBT) [1] is an emerging test methodology that integrates several complementary test technologies to restore test coverage lost due to diminishing physical (probe) access to printed circuit boards. While NBT boundary-scan test provides a core capability for structural test (e.g., shorts & opens), NBT processor-controlled test adds an element of functional test (e.g., at-speed operation) and NBT built-in self test delivers performance test (e.g., on-margin operation). A framework to consider the overall test coverage in these multiple dimensions is required to assess the full impact of the test strategy.
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