基于CMOS 45纳米技术的组合电路容错设计与仿真

Vanga Karunakar Reddy, Ravi Kumar Av
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摘要

在本文中,。由于我们设计了复杂的电路,可能会有错误或故障。故障可能卡在' 0 ',卡在' 1',或者可能是桥接故障。为了识别电路中的故障或错误,我们需要验证每个模块,以确定是否发生了错误或故障。从而降低电路的复杂度,并在电路设计完成后进行一次误差识别。为了克服电路中的故障,我们采用了自检多路复用器。本文设计的是自修复型2:1多路复用器。通过设计这种电路,我们可以发现并修复各种故障。本文提出了两种方法,第一种方法是检测和纠正Mux中的故障。检测和纠正基本门的故障。新模型的误差精度可以达到100%。为了设计所提出的快速全加法器,我们采用混合逻辑风格。采用45纳米CMOS Mentor图形技术对该方法进行了设计和分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and Simulation of Fault Tolerances in Combinational Circuits Using CMOS 45nm Technology
In this paper,. As we designed complexity circuit there may be any errors or faults. The faults may be stuck at ‘0’, stuck at ‘1'or may be a bridge fault. In order to identify the fault or error in circuit we need to verify each and every block to identify whether error or fault occurred. So to decrease the complexity of circuit and to identify error once after the design of circuit is completed. So to overcome the faults in circuit we are using self-checking multiplexer. Here we are designing self- repairing 2:1 multiplexer. By designing this circuit we can find and repair all kind of faults. In this paper proposing two methods in that the first method is detected and correct fault in Mux. Detect and correct faults in basic gates. New models can give 100% error accuracy. To design the proposed fast full adder here we are using hybrid logic style. This proposed method has been designed and analyzed using CMOS Mentor graphics 45nm Technology.
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