用阴影法测量光辐射的波前畸变

V. Bredikhin, S. P. Kuznetsov
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引用次数: 0

摘要

提出了用阴影法测量光学元件波前畸变的方法。福柯刀口相互垂直方向得到的阴影图是描述波前起伏的函数的梯度分量的分布,可以通过积分的方法恢复其形状。给出了用IAB 451测量大型光学KDP晶体元件波前畸变的实例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurements of wavefront distortions of optical radiation using a shadow method
The technique for measuring wave front distortions in optical elements by the shadow method is developed. Shadow pictures obtained for mutually perpendicular orientations of the Foucault knife-edge are the distributions of components of the gradient of the function describing the wave front relief, so that its shape can be restored by means of integration. An example of measurements of wave front distortions in large-scale optical KDP crystal elements employing the IAB 451 device is given.
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