{"title":"基于多步和高分辨率游标的TDC架构","authors":"M. Rashdan","doi":"10.1109/ICM.2017.8268819","DOIUrl":null,"url":null,"abstract":"A multi-step time-to-digital converter (TDC) architecture, based on a Vernier delay line, that achieves single-cycle latency and high time resolution for high-data-rate applications is presented. The architecture uses multiple TDC stages to reduce the used number of flip-flops and delay elements, which reduces the power consumption. The design details of the two step, three-step TDC architectures have been introduced using the proposed design. A 4-bit TDC has been designed and simulated in 65nm CMOS and compared to a conventional Vernier-based 4-bit TDC circuit. The power consumption is reduced by 50% due to using less circuit components. The design details for a 6-bit TDC that achieves single-cycle latency and high time resolution are also presented.","PeriodicalId":115975,"journal":{"name":"2017 29th International Conference on Microelectronics (ICM)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Multi-step and high-resolution vernier-based TDC architecture\",\"authors\":\"M. Rashdan\",\"doi\":\"10.1109/ICM.2017.8268819\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A multi-step time-to-digital converter (TDC) architecture, based on a Vernier delay line, that achieves single-cycle latency and high time resolution for high-data-rate applications is presented. The architecture uses multiple TDC stages to reduce the used number of flip-flops and delay elements, which reduces the power consumption. The design details of the two step, three-step TDC architectures have been introduced using the proposed design. A 4-bit TDC has been designed and simulated in 65nm CMOS and compared to a conventional Vernier-based 4-bit TDC circuit. The power consumption is reduced by 50% due to using less circuit components. The design details for a 6-bit TDC that achieves single-cycle latency and high time resolution are also presented.\",\"PeriodicalId\":115975,\"journal\":{\"name\":\"2017 29th International Conference on Microelectronics (ICM)\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 29th International Conference on Microelectronics (ICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2017.8268819\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 29th International Conference on Microelectronics (ICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2017.8268819","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Multi-step and high-resolution vernier-based TDC architecture
A multi-step time-to-digital converter (TDC) architecture, based on a Vernier delay line, that achieves single-cycle latency and high time resolution for high-data-rate applications is presented. The architecture uses multiple TDC stages to reduce the used number of flip-flops and delay elements, which reduces the power consumption. The design details of the two step, three-step TDC architectures have been introduced using the proposed design. A 4-bit TDC has been designed and simulated in 65nm CMOS and compared to a conventional Vernier-based 4-bit TDC circuit. The power consumption is reduced by 50% due to using less circuit components. The design details for a 6-bit TDC that achieves single-cycle latency and high time resolution are also presented.