{"title":"增强后向散射中的相位屏效应","authors":"A. Dogariu, G. Boreman","doi":"10.1364/aoipm.1996.pmst75","DOIUrl":null,"url":null,"abstract":"The enhanced backscattering (EBS) phenomenon is investigated in the complex case of structures modeled as ensembles of random phase screens, lenses, and volume-scattering media. Effects on the peak shape and magnitude are discussed and possible solutions to problems encountered in using EBS to characterize random media are suggested.","PeriodicalId":368664,"journal":{"name":"Advances in Optical Imaging and Photon Migration","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Phase Screen Effects in Enhanced Backscattering\",\"authors\":\"A. Dogariu, G. Boreman\",\"doi\":\"10.1364/aoipm.1996.pmst75\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The enhanced backscattering (EBS) phenomenon is investigated in the complex case of structures modeled as ensembles of random phase screens, lenses, and volume-scattering media. Effects on the peak shape and magnitude are discussed and possible solutions to problems encountered in using EBS to characterize random media are suggested.\",\"PeriodicalId\":368664,\"journal\":{\"name\":\"Advances in Optical Imaging and Photon Migration\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advances in Optical Imaging and Photon Migration\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/aoipm.1996.pmst75\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in Optical Imaging and Photon Migration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/aoipm.1996.pmst75","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The enhanced backscattering (EBS) phenomenon is investigated in the complex case of structures modeled as ensembles of random phase screens, lenses, and volume-scattering media. Effects on the peak shape and magnitude are discussed and possible solutions to problems encountered in using EBS to characterize random media are suggested.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
