{"title":"欢迎参加IEEE DTS ' 21会议","authors":"","doi":"10.1109/dts48731.2020.9196101","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":158426,"journal":{"name":"2021 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Welcome to the IEEE DTS’21 Conference\",\"authors\":\"\",\"doi\":\"10.1109/dts48731.2020.9196101\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":158426,\"journal\":{\"name\":\"2021 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/dts48731.2020.9196101\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/dts48731.2020.9196101","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}