{"title":"使用PRBS输入向量的连续时间模拟滤波电路测试","authors":"M. Al-Qutayri","doi":"10.1109/MELCON.2004.1346787","DOIUrl":null,"url":null,"abstract":"This paper outlines the problems associated with testing analog and mixed-signal circuits. It discusses the failure modes and fault models used. It then proposes a go no go test method for analog circuits. The method is based on the excitation of the circuit-under-test with a pseudo random binary sequence and the subsequent analysis of the captured response. The fault detection capabilities of the test and data analysis method are demonstrated by applying them to a continuous time filter circuit operating in the mid-band frequency range. An initial assessment of the impact of the input test sequence length on the detectability of faults is also discussed.","PeriodicalId":164818,"journal":{"name":"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Continuous time analog filter circuits testing using PRBS input vectors\",\"authors\":\"M. Al-Qutayri\",\"doi\":\"10.1109/MELCON.2004.1346787\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper outlines the problems associated with testing analog and mixed-signal circuits. It discusses the failure modes and fault models used. It then proposes a go no go test method for analog circuits. The method is based on the excitation of the circuit-under-test with a pseudo random binary sequence and the subsequent analysis of the captured response. The fault detection capabilities of the test and data analysis method are demonstrated by applying them to a continuous time filter circuit operating in the mid-band frequency range. An initial assessment of the impact of the input test sequence length on the detectability of faults is also discussed.\",\"PeriodicalId\":164818,\"journal\":{\"name\":\"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MELCON.2004.1346787\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MELCON.2004.1346787","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Continuous time analog filter circuits testing using PRBS input vectors
This paper outlines the problems associated with testing analog and mixed-signal circuits. It discusses the failure modes and fault models used. It then proposes a go no go test method for analog circuits. The method is based on the excitation of the circuit-under-test with a pseudo random binary sequence and the subsequent analysis of the captured response. The fault detection capabilities of the test and data analysis method are demonstrated by applying them to a continuous time filter circuit operating in the mid-band frequency range. An initial assessment of the impact of the input test sequence length on the detectability of faults is also discussed.