低损耗沟槽线的仿真与实验评价

Nisha Gupta, N. Jacob, W. Chamma, L. Shafai, S. Raut, A. Asi
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引用次数: 1

摘要

本文提出了一种新型的低损耗沟槽微带线结构。这条线的色散特性是用众所周知的数值技术——线法(MOL)来确定的。最后计算了1 ~ 16 GHz频率范围内的导体损耗和介质损耗,并与实验结果进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Simulation and experimental evaluation of the low loss grooved lines
This paper presents a new Grooved Microstrip Line structure(GMLS) for low loss configuration. The dispersion characteristics of this line is determined using the well known numerical technique, the Method of lines(MOL). Finally the conductor and dielectric losses are calculated and compared with the experimental result in the frequency range of 1–16 GHz.
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