基于改进级联R-CNN的铝表面缺陷检测研究

Yuge Xu, Zixing Guo, Xie Zhang, Chuanlong Lv
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引用次数: 0

摘要

铝型材具有良好的特性,广泛应用于许多行业。铝型材表面缺陷会影响产品的质量、可靠性和安全性。近年来,深度学习在铝型材表面缺陷检测中得到了广泛的应用。然而,仍有一些问题没有解决。在特征提取中,细小的缺陷容易被忽略。不同铝表面缺陷的长宽比差异很大,但传统深度学习算法中的固定锚盒容易遗漏缺陷。由于缺乏对背景图像的训练,一些背景很容易被误认为是缺陷。为了解决这些问题,提出了一种具有可变形卷积、导向锚定和样本增强的新型级联R-CNN网络(GAE-Cascade R-CNN模型)。可变形卷积增强了网络的特征提取能力。引导锚定通过自动生成锚点来匹配窄缺陷,从而减少了漏检。该方法通过训练大量的背景图像,有效地减少了缺陷检测的缺失。实验结果表明,本文提出的GAE-Cascade R-CNN模型对铝型材表面缺陷的识别精度达到98.85%,平均平均精度(mAP)达到80.55%。在漏检率和误检率方面,该网络的性能优于其他深度学习方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Research on Surface Defect Detection of Aluminum Based on Improved Cascade R-CNN
Aluminum profiles are widely used in many industries with good characteristics. Surface defects of aluminum profiles will affect the quality, reliability and safety of products. In recent years, deep learning has been applied in aluminum profile surface defect detection. However, there are still some problems unsolved. The tiny and narrow defects are easily ignored in feature extraction. The length-width ratio of different aluminum surface defects varies widely, but the fixed anchor boxes in traditional deep learning algorithms will easily miss defects. Due to the lack of training on background images, some backgrounds are easily misidentified as defects. To address these problems, a novel Cascade R-CNN network with deformable convolution, guided anchoring and sample augmentation (GAE-Cascade R-CNN model) is proposed. The deformable convolution enhances the feature extraction ability of the network. The guided anchoring reduces the missed detection by automatically generating anchors to match narrow defects. The sample augmentation effectively reduces missed defect detection by training a large number of background images. The experimental results show that the proposed GAE-Cascade R-CNN model can achieve accuracy of 98.85% for identification and mean average precision (mAP) of 80.55% for surface defect detection of aluminum profiles. The performance of the proposed network outperforms other deep learning methods in terms of both missed detection rate and false detection rate.
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