Li-bo Cheng, F. Anghinolfi, Ke Wang, Hong-Bo Zhu, W. Lu, Zhen-an Liu
{"title":"基于UVM的ABCStar测试平台研究","authors":"Li-bo Cheng, F. Anghinolfi, Ke Wang, Hong-Bo Zhu, W. Lu, Zhen-an Liu","doi":"10.1109/RTC.2016.7543181","DOIUrl":null,"url":null,"abstract":"As physicists want to put more and more functionalities and algorithms into frontend ASICs, the logic design (of some ASICs) become more and more complicated. A reliable, robust functional verification testbench is one of the most important part during ASIC design. This paper presents a well-constructed testbench based on Universal Verification Methodology(UVM) research for ATLAS Phase-II upgrade silicon strip detector front-end readout chip.","PeriodicalId":383702,"journal":{"name":"2016 IEEE-NPSS Real Time Conference (RT)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A testbench research based on UVM for ABCStar\",\"authors\":\"Li-bo Cheng, F. Anghinolfi, Ke Wang, Hong-Bo Zhu, W. Lu, Zhen-an Liu\",\"doi\":\"10.1109/RTC.2016.7543181\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As physicists want to put more and more functionalities and algorithms into frontend ASICs, the logic design (of some ASICs) become more and more complicated. A reliable, robust functional verification testbench is one of the most important part during ASIC design. This paper presents a well-constructed testbench based on Universal Verification Methodology(UVM) research for ATLAS Phase-II upgrade silicon strip detector front-end readout chip.\",\"PeriodicalId\":383702,\"journal\":{\"name\":\"2016 IEEE-NPSS Real Time Conference (RT)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-08-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE-NPSS Real Time Conference (RT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RTC.2016.7543181\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE-NPSS Real Time Conference (RT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RTC.2016.7543181","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
As physicists want to put more and more functionalities and algorithms into frontend ASICs, the logic design (of some ASICs) become more and more complicated. A reliable, robust functional verification testbench is one of the most important part during ASIC design. This paper presents a well-constructed testbench based on Universal Verification Methodology(UVM) research for ATLAS Phase-II upgrade silicon strip detector front-end readout chip.