{"title":"多层介质厚度测量的数字信号处理方法","authors":"C. Delebarre, C. Bruneel, P. Miquet","doi":"10.1109/ULTSYM.1988.49533","DOIUrl":null,"url":null,"abstract":"An ultrasonic thickness measurement system for the 20- to 110- mu m range has been developed for thin paint layers on metallic or nonmetallic substrates. In the case of a multilayered sample this system generally furnishes only the sum of the different thicknesses. Thus, a digital signal-processing method has been developed to extract the different values of thickness from the power spectral density. This method is based on a power cepstrum analysis, defined as the Fourier transform of the logarithm power spectral density of the radio-frequency signal. This technique gives, in the case of three layers, the three thicknesses and their linear combinations. Experimental results confirm the effectiveness of the proposed method.<<ETX>>","PeriodicalId":263198,"journal":{"name":"IEEE 1988 Ultrasonics Symposium Proceedings.","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Digital signal processing method for multilayered media thickness measurement\",\"authors\":\"C. Delebarre, C. Bruneel, P. Miquet\",\"doi\":\"10.1109/ULTSYM.1988.49533\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An ultrasonic thickness measurement system for the 20- to 110- mu m range has been developed for thin paint layers on metallic or nonmetallic substrates. In the case of a multilayered sample this system generally furnishes only the sum of the different thicknesses. Thus, a digital signal-processing method has been developed to extract the different values of thickness from the power spectral density. This method is based on a power cepstrum analysis, defined as the Fourier transform of the logarithm power spectral density of the radio-frequency signal. This technique gives, in the case of three layers, the three thicknesses and their linear combinations. Experimental results confirm the effectiveness of the proposed method.<<ETX>>\",\"PeriodicalId\":263198,\"journal\":{\"name\":\"IEEE 1988 Ultrasonics Symposium Proceedings.\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1988 Ultrasonics Symposium Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ULTSYM.1988.49533\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1988 Ultrasonics Symposium Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULTSYM.1988.49533","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Digital signal processing method for multilayered media thickness measurement
An ultrasonic thickness measurement system for the 20- to 110- mu m range has been developed for thin paint layers on metallic or nonmetallic substrates. In the case of a multilayered sample this system generally furnishes only the sum of the different thicknesses. Thus, a digital signal-processing method has been developed to extract the different values of thickness from the power spectral density. This method is based on a power cepstrum analysis, defined as the Fourier transform of the logarithm power spectral density of the radio-frequency signal. This technique gives, in the case of three layers, the three thicknesses and their linear combinations. Experimental results confirm the effectiveness of the proposed method.<>