{"title":"超材料结构的有效阻抗建模","authors":"K. Dossou, C. Poulton, L. Botten","doi":"10.1364/JOSAA.33.000361","DOIUrl":null,"url":null,"abstract":"We present methods for retrieving the effective impedance of metamaterials from the Fresnel reflection coefficients at the interface between two semi-infinite media. The derivation involves the projection of modal expansions onto the dominant modes of the two semi-infinite media. It is shown that a number of effective impedance formulas, previously obtained by field averaging techniques, can also be derived from the scattering-based formalism, by an appropriate choice of projection.","PeriodicalId":425705,"journal":{"name":"2016 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Effective impedance modeling of metamaterial structures\",\"authors\":\"K. Dossou, C. Poulton, L. Botten\",\"doi\":\"10.1364/JOSAA.33.000361\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present methods for retrieving the effective impedance of metamaterials from the Fresnel reflection coefficients at the interface between two semi-infinite media. The derivation involves the projection of modal expansions onto the dominant modes of the two semi-infinite media. It is shown that a number of effective impedance formulas, previously obtained by field averaging techniques, can also be derived from the scattering-based formalism, by an appropriate choice of projection.\",\"PeriodicalId\":425705,\"journal\":{\"name\":\"2016 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/JOSAA.33.000361\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/JOSAA.33.000361","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effective impedance modeling of metamaterial structures
We present methods for retrieving the effective impedance of metamaterials from the Fresnel reflection coefficients at the interface between two semi-infinite media. The derivation involves the projection of modal expansions onto the dominant modes of the two semi-infinite media. It is shown that a number of effective impedance formulas, previously obtained by field averaging techniques, can also be derived from the scattering-based formalism, by an appropriate choice of projection.