STarS:一种用于顺序测试生成的目标切换算法

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI:10.1109/VTEST.1991.208160

M. A. Heap, W. A. Rogers, William B. Burns

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引用次数: 0

摘要

介绍了一种新的顺序电路的确定性测试图生成算法。顺序目标切换(STarS)算法开始为特定的目标故障生成测试序列，但是在生成每个模式时，它会跟踪可能也使用此序列作为测试一部分的故障集。通过将目标故障切换到该故障集中的一个成员来避免回溯，并且部分序列被尽可能地重用

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STarS: a target switching algorithm for sequential test generation

The authors introduce a new deterministic test pattern generation algorithm for sequential circuits. The Sequential Target Switching (STarS) algorithm begins generating a test sequence for a specific target fault, but as each pattern is generated, it keeps track of the set of faults that may also use this sequence as part of a test. Backtracking is avoided by switching the target fault to a member of this fault set, and partial sequences are re-used as much as possible.<>

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Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's

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