集成电路的单事件闭锁保护

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI:10.1109/RADECS.1997.698919

P. Layton, D. Czajkowski, J. Marshall, H. Anthony, R. Boss

{"title":"集成电路的单事件闭锁保护","authors":"P. Layton, D. Czajkowski, J. Marshall, H. Anthony, R. Boss","doi":"10.1109/RADECS.1997.698919","DOIUrl":null,"url":null,"abstract":"This paper will report the test results from the development of the single event latchup protection circuitry (referred to as Space Electronics Inc.'s (SEIs) Latchup Protection Technology (LPT/sup TM/)) for several integrated circuits which are known to latchup at unacceptably low LET energies for space applications. Two devices were evaluated with LPT/sup TM/; the ADS7805 16 bit analog to digital converter and the GF10009 FPGA (Gatefield's 9000 gate flash programmable gate array).","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":"{\"title\":\"Single event latchup protection of integrated circuits\",\"authors\":\"P. Layton, D. Czajkowski, J. Marshall, H. Anthony, R. Boss\",\"doi\":\"10.1109/RADECS.1997.698919\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper will report the test results from the development of the single event latchup protection circuitry (referred to as Space Electronics Inc.'s (SEIs) Latchup Protection Technology (LPT/sup TM/)) for several integrated circuits which are known to latchup at unacceptably low LET energies for space applications. Two devices were evaluated with LPT/sup TM/; the ADS7805 16 bit analog to digital converter and the GF10009 FPGA (Gatefield's 9000 gate flash programmable gate array).\",\"PeriodicalId\":106774,\"journal\":{\"name\":\"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"25\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.1997.698919\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1997.698919","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 25

摘要

本文将报告单事件闭锁保护电路(称为空间电子公司(SEIs)的闭锁保护技术(LPT/sup TM/))开发的测试结果，这些集成电路已知在空间应用中以不可接受的低LET能量闭锁。用LPT/sup TM/对两种器械进行评价;ADS7805 16位模数转换器和GF10009 FPGA (Gatefield的9000门闪存可编程门阵列)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Single event latchup protection of integrated circuits

This paper will report the test results from the development of the single event latchup protection circuitry (referred to as Space Electronics Inc.'s (SEIs) Latchup Protection Technology (LPT/sup TM/)) for several integrated circuits which are known to latchup at unacceptably low LET energies for space applications. Two devices were evaluated with LPT/sup TM/; the ADS7805 16 bit analog to digital converter and the GF10009 FPGA (Gatefield's 9000 gate flash programmable gate array).

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)

自引率

0.00%

发文量