M. U. Uyar, Yu Wang, S. S. Batth, A. Wise, M. Fecko
{"title":"多计时器系统的定时故障模型","authors":"M. U. Uyar, Yu Wang, S. S. Batth, A. Wise, M. Fecko","doi":"10.1007/11430230_14","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Timing Fault Models for Systems with Multiple Timers\",\"authors\":\"M. U. Uyar, Yu Wang, S. S. Batth, A. Wise, M. Fecko\",\"doi\":\"10.1007/11430230_14\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":433439,\"journal\":{\"name\":\"International Conference on Testing (of Software and) Communication Systems\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-03-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Testing (of Software and) Communication Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/11430230_14\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Testing (of Software and) Communication Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/11430230_14","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}