Localization of thin metallic scatterers by experimental data

The problem of detecting and localizing "small" scatterers by the knowledge of the field scattered under a known illumination is dealt with. According to the distributional model shown in Ref. [2], the problem is cast as the inversion of a linear integral operator acting on 6-distributions whose supports are representative of the scatterers' locations. In this paper, we present some experimental results of such an approach. To this end, we perform the reconstructions by exploiting experimental scattered field data collected in controlled conditions at the Electromagnetic Diagnostic Laboratory of the Second University of Naples. The multi-static/single-view/multi-frequency and the multi-static/multi-view/multi-frequency configurations are both considered.