部分耗尽SOI紧凑模型的建立与参数提取

S. Fung, L. Wagner, M. Sherony, N. Zamdmer, J. Sleight, M. Michel, E. Leobandung, S.-H. Lo, T. Chen, F. Assaderaghi
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引用次数: 4

摘要

随着SOI技术的发展成为主流,精确和可预测的紧凑模型是确保VLSI芯片设计成功的必要条件。本文描述了一个紧凑的模型,该模型有助于在初始设计时成功实现复杂的660mhz 64位PowerPC。该模型正确捕获了所有重要的SOI特定器件特性和电路行为。参数提取方法,这是必不可少的,以实现一个高度准确的模型,将讨论。将介绍使用0.18 um (1.5 V)高性能SOI CMOS技术的验证结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A partially-depleted SOI compact model - formulation and parameter extraction
As SOI technology advances into mainstream, an accurate and predictive compact model is necessary to ensure the success of VLSI chip design. This paper describes a compact model which contributes to the successful implementation of the sophisticated 660 MHz 64-bit PowerPC at its first design. This model captures all important SOI specific device characteristics and circuit behavior properly. The parameter extraction methodology, which is essential in achieving a highly accurate model, will be discussed. Verification results using a 0.18 um (1.5 V) high performance SOI CMOS technology will be presented.
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