Brendan Mullane, Vincent O’Brien, Ciaran MacNamee, Thomas Fleischmann
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A2DTest: A complete integrated solution for on-chip ADC self-test and analysis
An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.
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