M. Lenner, Chen-Pu Hsu, Lin Yang, A. Frank, K. Bohnert
{"title":"光纤电流传感器保偏光纤连接器的性能和长期可靠性","authors":"M. Lenner, Chen-Pu Hsu, Lin Yang, A. Frank, K. Bohnert","doi":"10.1109/ICSENS.2018.8589593","DOIUrl":null,"url":null,"abstract":"The performance and long-term reliability of polarization-maintaining (PM) fiber-optic connectors is studied experimentally for use in interferometric fiber-optic current sensors. In particular, we investigate the effect of accelerated ageing and repeated open/close operations on the connectors' polarization extinction ratio (PER) and insertion loss between -40 and 80°C and determine the influence on sensor accuracy. The results show that PM connectors (FC/PC type with reduced mechanical tolerances for high PER) exhibit good repeatability and largely preserve their performance over extended periods of ageing. Nevertheless, the observed long-term changes in the temperature dependence of the PER can restrict the usability of these components in high-end sensor applications and call for alternative solutions.","PeriodicalId":405874,"journal":{"name":"2018 IEEE SENSORS","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Performance and Long-Term Reliability of Polarization-Maintaining Fiber Connectors for Fiber-Optic Current Sensors\",\"authors\":\"M. Lenner, Chen-Pu Hsu, Lin Yang, A. Frank, K. Bohnert\",\"doi\":\"10.1109/ICSENS.2018.8589593\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The performance and long-term reliability of polarization-maintaining (PM) fiber-optic connectors is studied experimentally for use in interferometric fiber-optic current sensors. In particular, we investigate the effect of accelerated ageing and repeated open/close operations on the connectors' polarization extinction ratio (PER) and insertion loss between -40 and 80°C and determine the influence on sensor accuracy. The results show that PM connectors (FC/PC type with reduced mechanical tolerances for high PER) exhibit good repeatability and largely preserve their performance over extended periods of ageing. Nevertheless, the observed long-term changes in the temperature dependence of the PER can restrict the usability of these components in high-end sensor applications and call for alternative solutions.\",\"PeriodicalId\":405874,\"journal\":{\"name\":\"2018 IEEE SENSORS\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE SENSORS\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSENS.2018.8589593\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE SENSORS","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSENS.2018.8589593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Performance and Long-Term Reliability of Polarization-Maintaining Fiber Connectors for Fiber-Optic Current Sensors
The performance and long-term reliability of polarization-maintaining (PM) fiber-optic connectors is studied experimentally for use in interferometric fiber-optic current sensors. In particular, we investigate the effect of accelerated ageing and repeated open/close operations on the connectors' polarization extinction ratio (PER) and insertion loss between -40 and 80°C and determine the influence on sensor accuracy. The results show that PM connectors (FC/PC type with reduced mechanical tolerances for high PER) exhibit good repeatability and largely preserve their performance over extended periods of ageing. Nevertheless, the observed long-term changes in the temperature dependence of the PER can restrict the usability of these components in high-end sensor applications and call for alternative solutions.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
