CMOS图像传感器的全方位双像素自动对焦技术

2021 Symposium on VLSI Circuits Pub Date : 2021-06-13 DOI:10.23919/VLSICircuits52068.2021.9492472

E. Shim, Kyungho Lee, J. Pyo, Wooseok Choi, Jungbin Yun, T. Jung, Kyungduck Lee, Seyoung Kim, Chanhee Lee, Seungki Baek, Hyuncheol Kim, Sungsoo Choi, Junseok Yang, Kyoungmok Son, Jongwon Choi, Howoo Park, Bumsuk Kim, JungChak Ahn, Duckhyun Chang

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引用次数: 7

摘要

我们开发了一种具有精确和全方位自动对焦性能的CMOS图像传感器(CIS)双像素。优化后的像素级深沟槽隔离(DTI)在整个图像区域和整个可见波长范围内提供了准确的自动对焦数据和良好的图像质量。此外，水平-垂直(HV)双像素与倾斜的像素内DTI使得传统的双像素读出方法能够获取全方位的自动对焦信息。这些技术在1.4μm双像素上得到了验证，并将应用于进一步缩小的像素。

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All-Directional Dual Pixel Auto Focus Technology in CMOS Image Sensors

We developed a dual pixel with accurate and all-directional auto focus (AF) performance in CMOS image sensor (CIS). The optimized in-pixel deep trench isolation (DTI) provided accurate AF data and good image quality in the entire image area and over whole visible wavelength range. Furthermore, the horizontal-vertical (HV) dual pixel with the slanted in-pixel DTI enabled the acquisition of all-directional AF information by the conventional dual pixel readout method. These technologies were demonstrated in 1.4μm dual pixel and will be applied to the further shrunken pixels.

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2021 Symposium on VLSI Circuits

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