x射线辐照对(Ga0.1In0.9) 2se3薄膜能量赝隙和折射率的影响

2021 IEEE 12th International Conference on Electronics and Information Technologies (ELIT) Pub Date : 2021-05-19 DOI:10.1109/ELIT53502.2021.9501118

M. Pop, M. Kranjčec, I. Studenyak, A. Solomon

{"title":"x射线辐照对(Ga0.1In0.9) 2se3薄膜能量赝隙和折射率的影响","authors":"M. Pop, M. Kranjčec, I. Studenyak, A. Solomon","doi":"10.1109/ELIT53502.2021.9501118","DOIUrl":null,"url":null,"abstract":"Thermal evaporation technique was used to deposite $\\gamma_{1}$ films. As-deposited thin films were irradiated by means of wideband radiation of Cu-anode X-ray tube at different exposition times. Spectral ellipsometry measurements were conducted in order to obtain refractive index and extinction coefficient dispersions. Optical transmission spectra of X-ray irradiated $(\\text{Ga}_{X}\\text{In}_{1\\rightarrow x})_{2}\\text{Se}_{3}$ films were measured depending on irradiation time. Parameters of Urbach absorption edge for X-ray irradiated $(\\mathbf{Ga}_{0.1}\\mathbf{In}_{0.9})_{2}\\mathbf{Se}_{3}$ films were studied. The investigation revealed the nonlinear decrease of energy pseudogap together with nonlinear increase of Urbach energy and refractive index, as well as the increase of X-ray irradiation time.","PeriodicalId":164798,"journal":{"name":"2021 IEEE 12th International Conference on Electronics and Information Technologies (ELIT)","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Influence of X-Ray Irradiation on Energy Pseudogap and Refractive Index of (Ga0.1In0.9)2Se3Films\",\"authors\":\"M. Pop, M. Kranjčec, I. Studenyak, A. Solomon\",\"doi\":\"10.1109/ELIT53502.2021.9501118\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thermal evaporation technique was used to deposite $\\\\gamma_{1}$ films. As-deposited thin films were irradiated by means of wideband radiation of Cu-anode X-ray tube at different exposition times. Spectral ellipsometry measurements were conducted in order to obtain refractive index and extinction coefficient dispersions. Optical transmission spectra of X-ray irradiated $(\\\\text{Ga}_{X}\\\\text{In}_{1\\\\rightarrow x})_{2}\\\\text{Se}_{3}$ films were measured depending on irradiation time. Parameters of Urbach absorption edge for X-ray irradiated $(\\\\mathbf{Ga}_{0.1}\\\\mathbf{In}_{0.9})_{2}\\\\mathbf{Se}_{3}$ films were studied. The investigation revealed the nonlinear decrease of energy pseudogap together with nonlinear increase of Urbach energy and refractive index, as well as the increase of X-ray irradiation time.\",\"PeriodicalId\":164798,\"journal\":{\"name\":\"2021 IEEE 12th International Conference on Electronics and Information Technologies (ELIT)\",\"volume\":\"2016 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 12th International Conference on Electronics and Information Technologies (ELIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELIT53502.2021.9501118\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 12th International Conference on Electronics and Information Technologies (ELIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELIT53502.2021.9501118","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

采用热蒸发技术沉积$\gamma_{1}$薄膜。采用cu阳极x射线管在不同曝光时间对砷沉积薄膜进行了宽带辐照。为了获得折射率和消光系数色散，进行了光谱椭偏测量。对$(\text{Ga}_{X}\text{In}_{1\rightarrow x})_{2}\text{Se}_{3}$ x射线辐照膜的透射光谱随辐照时间的变化进行了测量。研究了x射线辐照$(\mathbf{Ga}_{0.1}\mathbf{In}_{0.9})_{2}\mathbf{Se}_{3}$薄膜的乌尔巴赫吸收边参数。研究发现，能量赝隙非线性减小，乌尔巴赫能和折射率非线性增加，x射线辐照时间增加。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Influence of X-Ray Irradiation on Energy Pseudogap and Refractive Index of (Ga0.1In0.9)2Se3Films

Thermal evaporation technique was used to deposite $\gamma_{1}$ films. As-deposited thin films were irradiated by means of wideband radiation of Cu-anode X-ray tube at different exposition times. Spectral ellipsometry measurements were conducted in order to obtain refractive index and extinction coefficient dispersions. Optical transmission spectra of X-ray irradiated $(\text{Ga}_{X}\text{In}_{1\rightarrow x})_{2}\text{Se}_{3}$ films were measured depending on irradiation time. Parameters of Urbach absorption edge for X-ray irradiated $(\mathbf{Ga}_{0.1}\mathbf{In}_{0.9})_{2}\mathbf{Se}_{3}$ films were studied. The investigation revealed the nonlinear decrease of energy pseudogap together with nonlinear increase of Urbach energy and refractive index, as well as the increase of X-ray irradiation time.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2021 IEEE 12th International Conference on Electronics and Information Technologies (ELIT)

自引率

0.00%

发文量