{"title":"通过无相层析成像表征材料:相位检索的数值结果","authors":"R. Pierri, G. Leone, R. Bernini","doi":"10.1364/srs.1998.sthc.3","DOIUrl":null,"url":null,"abstract":"The diffraction tomography is a new method in which the complex\n permittivity profile of an object is reconstructed using algorithms\n that require the knowledge of both the amplitude and the phase of the\n scattered field [1-2]. However the difficulty of\n obtaining the phase of the scattered field at optical frequencies has\n limited the practical applications of diffraction tomography.","PeriodicalId":184407,"journal":{"name":"Signal Recovery and Synthesis","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Material characterization via phaseless tomography : numerical results in phase retrieval\",\"authors\":\"R. Pierri, G. Leone, R. Bernini\",\"doi\":\"10.1364/srs.1998.sthc.3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The diffraction tomography is a new method in which the complex\\n permittivity profile of an object is reconstructed using algorithms\\n that require the knowledge of both the amplitude and the phase of the\\n scattered field [1-2]. However the difficulty of\\n obtaining the phase of the scattered field at optical frequencies has\\n limited the practical applications of diffraction tomography.\",\"PeriodicalId\":184407,\"journal\":{\"name\":\"Signal Recovery and Synthesis\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Signal Recovery and Synthesis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/srs.1998.sthc.3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Signal Recovery and Synthesis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/srs.1998.sthc.3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Material characterization via phaseless tomography : numerical results in phase retrieval
The diffraction tomography is a new method in which the complex
permittivity profile of an object is reconstructed using algorithms
that require the knowledge of both the amplitude and the phase of the
scattered field [1-2]. However the difficulty of
obtaining the phase of the scattered field at optical frequencies has
limited the practical applications of diffraction tomography.