{"title":"几种用于预测GaAs HEMT线性功率放大器性能的大信号电容模型的检验","authors":"J. Staudinger, M. de Baca, R. Vaitkus","doi":"10.1109/RAWCON.1998.709207","DOIUrl":null,"url":null,"abstract":"This article examines several methods of modeling the charge/capacitance characteristics of GaAs HEMT devices for use in large signal models applied to the design and simulation of linear power amplifiers. Emphasis is placed on the effect these charge/capacitance models exhibit on the accuracy of the large signal model to predict linear power amplifier characteristics including gain, output power, efficiency, and linearity. Model predictions are contrasted to on-wafer load pull measurements made using a single-tone sinusoid, two-tone sinusoid, and a /spl pi//4 DQPSK stimuli compliant to the NADC standard. The results suggest the description of the device's charge/capacitance characteristics significantly effects large signal model accuracy.","PeriodicalId":226788,"journal":{"name":"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"An examination of several large signal capacitance models to predict GaAs HEMT linear power amplifier performance\",\"authors\":\"J. Staudinger, M. de Baca, R. Vaitkus\",\"doi\":\"10.1109/RAWCON.1998.709207\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article examines several methods of modeling the charge/capacitance characteristics of GaAs HEMT devices for use in large signal models applied to the design and simulation of linear power amplifiers. Emphasis is placed on the effect these charge/capacitance models exhibit on the accuracy of the large signal model to predict linear power amplifier characteristics including gain, output power, efficiency, and linearity. Model predictions are contrasted to on-wafer load pull measurements made using a single-tone sinusoid, two-tone sinusoid, and a /spl pi//4 DQPSK stimuli compliant to the NADC standard. The results suggest the description of the device's charge/capacitance characteristics significantly effects large signal model accuracy.\",\"PeriodicalId\":226788,\"journal\":{\"name\":\"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)\",\"volume\":\"71 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAWCON.1998.709207\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAWCON.1998.709207","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An examination of several large signal capacitance models to predict GaAs HEMT linear power amplifier performance
This article examines several methods of modeling the charge/capacitance characteristics of GaAs HEMT devices for use in large signal models applied to the design and simulation of linear power amplifiers. Emphasis is placed on the effect these charge/capacitance models exhibit on the accuracy of the large signal model to predict linear power amplifier characteristics including gain, output power, efficiency, and linearity. Model predictions are contrasted to on-wafer load pull measurements made using a single-tone sinusoid, two-tone sinusoid, and a /spl pi//4 DQPSK stimuli compliant to the NADC standard. The results suggest the description of the device's charge/capacitance characteristics significantly effects large signal model accuracy.