{"title":"关于使用硬故障生成测试集","authors":"I. Voyiatzis, C. Efstathiou","doi":"10.1145/2801948.2801951","DOIUrl":null,"url":null,"abstract":"In test set embedding Built-In Self-Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware module. In this work we first apply a sequence of pseudorandom patterns and then try to embed patterns for the remaining faults (i.e. \"extremely hard\" faults) in the sequence generated by the hardware generator.","PeriodicalId":305252,"journal":{"name":"Proceedings of the 19th Panhellenic Conference on Informatics","volume":"141 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On the use of hard faults to generate test sets\",\"authors\":\"I. Voyiatzis, C. Efstathiou\",\"doi\":\"10.1145/2801948.2801951\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In test set embedding Built-In Self-Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware module. In this work we first apply a sequence of pseudorandom patterns and then try to embed patterns for the remaining faults (i.e. \\\"extremely hard\\\" faults) in the sequence generated by the hardware generator.\",\"PeriodicalId\":305252,\"journal\":{\"name\":\"Proceedings of the 19th Panhellenic Conference on Informatics\",\"volume\":\"141 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 19th Panhellenic Conference on Informatics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2801948.2801951\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 19th Panhellenic Conference on Informatics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2801948.2801951","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In test set embedding Built-In Self-Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware module. In this work we first apply a sequence of pseudorandom patterns and then try to embed patterns for the remaining faults (i.e. "extremely hard" faults) in the sequence generated by the hardware generator.
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