位片处理器的交互式诊断/调试子系统

MICRO 18 Pub Date : 1985-12-01 DOI:10.1145/18927.18910
F. Burkowski
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引用次数: 1

摘要

本文讨论了位片处理器调试/诊断子系统的设计与实现。该子系统在单片机的控制下使用串行影子寄存器来观察和控制处理器的行为。串行线将微型计算机连接到诊断主机,该主机为用户提供一套全面的交互式诊断命令。使用这些命令,用户能够加载可写控制存储,验证其内容,加载映射工具,设置断点并在单步序列期间检查寄存器。该子系统可以大大加快固件开发过程,并且当将其作为永久功能纳入设计时,它为系统生命周期内的寄存器级诊断提供了非常低成本的设施。诊断子系统在多个处理器之间的可移植性也是可能的,并且有助于在现场对机器诊断进行有效的管理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An interactive diagnostic/debugging subsystem for bit-slice processors
This paper discusses the design and implementation of a debugging/diagnostic subsystem for a bit-slice processor. The subsystem uses serial shadow registers under the control of a single chip microcomputer both to observe and to control processor behavior. Serial lines link the microcomputer to a diagnostic host which provides the user with a comprehensive set of interactive diagnostic commands. Using these commands, the user is able to load the writable control store, verify its contents, load mapping facilities, set breakpoints and examine registers during single-stepping sequences. The subsystem can considerably speed up the firmware development process and when incorporated into the design as a permanent feature, it provides a very low-cost facility for register-level diagnostics during the life of the system. Portability of the diagnostic subsystem across a number of processors is also possible and is conducive to the efficient management of machine diagnosis in the field.
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