{"title":"位片处理器的交互式诊断/调试子系统","authors":"F. Burkowski","doi":"10.1145/18927.18910","DOIUrl":null,"url":null,"abstract":"This paper discusses the design and implementation of a debugging/diagnostic subsystem for a bit-slice processor. The subsystem uses serial shadow registers under the control of a single chip microcomputer both to observe and to control processor behavior. Serial lines link the microcomputer to a diagnostic host which provides the user with a comprehensive set of interactive diagnostic commands. Using these commands, the user is able to load the writable control store, verify its contents, load mapping facilities, set breakpoints and examine registers during single-stepping sequences. The subsystem can considerably speed up the firmware development process and when incorporated into the design as a permanent feature, it provides a very low-cost facility for register-level diagnostics during the life of the system. Portability of the diagnostic subsystem across a number of processors is also possible and is conducive to the efficient management of machine diagnosis in the field.","PeriodicalId":221754,"journal":{"name":"MICRO 18","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An interactive diagnostic/debugging subsystem for bit-slice processors\",\"authors\":\"F. Burkowski\",\"doi\":\"10.1145/18927.18910\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the design and implementation of a debugging/diagnostic subsystem for a bit-slice processor. The subsystem uses serial shadow registers under the control of a single chip microcomputer both to observe and to control processor behavior. Serial lines link the microcomputer to a diagnostic host which provides the user with a comprehensive set of interactive diagnostic commands. Using these commands, the user is able to load the writable control store, verify its contents, load mapping facilities, set breakpoints and examine registers during single-stepping sequences. The subsystem can considerably speed up the firmware development process and when incorporated into the design as a permanent feature, it provides a very low-cost facility for register-level diagnostics during the life of the system. Portability of the diagnostic subsystem across a number of processors is also possible and is conducive to the efficient management of machine diagnosis in the field.\",\"PeriodicalId\":221754,\"journal\":{\"name\":\"MICRO 18\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"MICRO 18\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/18927.18910\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"MICRO 18","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/18927.18910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An interactive diagnostic/debugging subsystem for bit-slice processors
This paper discusses the design and implementation of a debugging/diagnostic subsystem for a bit-slice processor. The subsystem uses serial shadow registers under the control of a single chip microcomputer both to observe and to control processor behavior. Serial lines link the microcomputer to a diagnostic host which provides the user with a comprehensive set of interactive diagnostic commands. Using these commands, the user is able to load the writable control store, verify its contents, load mapping facilities, set breakpoints and examine registers during single-stepping sequences. The subsystem can considerably speed up the firmware development process and when incorporated into the design as a permanent feature, it provides a very low-cost facility for register-level diagnostics during the life of the system. Portability of the diagnostic subsystem across a number of processors is also possible and is conducive to the efficient management of machine diagnosis in the field.