径向结构对横向大功率砷化镓光导开关性能的影响

Z. Hemmat, E. Moreno, Farhood Rasouli, S. Alizad
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引用次数: 0

摘要

本文研究了径向结构对线侧向砷化镓高功率光导半导体开关(PCSS)性能的影响。为此,采用三维器件建模方法对光引发砷化镓开关进行建模。在这个模拟中,以碳作为浅受体的p型器件由深供体EL2电平作为陷阱电平补偿。PCSS器件采用反向触发的径向对称开关结构,通过降低电极附近的峰值电场来延长阻塞电压。进行了器件建模,并研究了不同陷阱浓度对暗I-V特性的影响。本文报道了器件厚度、不同偏置电压和光功率密度对瞬态仿真的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of radial structure on the performance of lateral high-power GaAs photoconductive switch
In this paper, the effect of radial structure on the performance of a linear-lateral GaAs high power photoconductive semiconductor switch (PCSS) is investigated. For this purpose a three-dimensional device modeling is used to model the optically initiated GaAs switch. In this simulation a p-type device with carbon as shallow acceptor is compensated by deep donor EL2 level as a trap level. The PCSS device is designed in a back-triggered, radially symmetric switch structure which extends the blocking voltage by reducing the peak electric field near the electrodes. Device modeling was performed and the effect of different trap concentrations on dark I-V characteristics has been investigated. In this paper effect of device thickness, different bias voltages and optical power density on transient simulation is reported.
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