基于压缩感知的单事件瞬态检测

C. Shao, Huiyun Li
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引用次数: 0

摘要

单事件瞬变(set)严重降低了集成电路(ic)的可靠性,特别是在任务或安全关键应用中。检测和定位集合可以用于故障分析和未来的增强。传统的SET检测方法通常需要在电路中嵌入特殊的传感器,或者对表面进行精细分辨率的辐射扫描进行检测。本文建立了集的稀疏性与总体故障的关系。然后,我们开发了一种压缩感知方法来检测集成电路中SET的位置,而不需要任何嵌入传感器或成像处理。用逻辑仿真的方法对一个加密集成电路进行了实例研究。结果表明,该方法具有两个主要优点:1)能够准确地识别SET敏感区域。2)采样率降低了70%,从而大大提高了测试效率,硬件开销可以忽略不计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Detection of Single Event Transients Based on Compressed Sensing
Single event transients (SETs) have seriously deteriorated the reliability Integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and future enhancement. Traditional SET detecting methods usually require special sensors embedded into the circuits, or radiation scanning with fine resolutions over the surface for inspection. In this paper, we establish the relationship between sparsity of SETs and the overall faults. Then we develop the method of compressed sensing to detect the location of SET in ICs, without any embed sensors or imaging procession. A case study on a cryptographic IC by logic simulation is demonstrated. It verifies that the proposed method has two main advantages: 1) the SET sensitive area can be accurately identified. 2) The sampling rate is reduced by 70%, therefore the test efficiency is largely enhanced with negligible hardware overhead.
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