M. Rozana, M. Wahid, A. Arshad, M. N. Sarip, Z. Habibah, L. N. Ismail, M. Rusop, Wan Haliza Abd Majid, W. C. Gan
{"title":"不同退火温度对聚偏氟乙烯-三氟乙烯薄膜形态和介电性能的影响","authors":"M. Rozana, M. Wahid, A. Arshad, M. N. Sarip, Z. Habibah, L. N. Ismail, M. Rusop, Wan Haliza Abd Majid, W. C. Gan","doi":"10.1109/SHUSER.2012.6268990","DOIUrl":null,"url":null,"abstract":"The morphology of PVDF-TrFE (70/30) thin film at various annealing temperature were investigated using non-contact mode Atomic Force Microscopy (AFM). Differential Scanning Calorimetry (DSC) technique was used to obtain T<sub>C</sub>, T<sub>m</sub>, and T<sub>Crys</sub> of PVDF-TrFE. The prepared spin coated PVDF-TrFE (70/30) thin films were annealed at T<sub>C</sub> (113°C), T<sub>m</sub> (154°C), T<sub>Crys</sub> (135°C) and T<sub>c</sub> at cooling (55°C) in accordance to the DSC thermogram observed. Impedance Spectroscopy were conducted to study the dielectric characteristic of the thin films in order to substantiate the electrical behavior of the thin films From the results obtained, the thin films exhibited different morphologies depending on the annealing temperatures utilized. Formation of needle-like crsytallite structure was observed film annealed at and over T<sub>m</sub>. Thin film re-crystallized at T<sub>C</sub> has an optimized dielectric constant of ~7.8 at 10<sup>4</sup> hz.","PeriodicalId":426671,"journal":{"name":"2012 IEEE Symposium on Humanities, Science and Engineering Research","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Effect of various annealing temperature on the morphological and dielectric properties of Polyvinylidenefluoride-Trifluoroethylene thin film\",\"authors\":\"M. Rozana, M. Wahid, A. Arshad, M. N. Sarip, Z. Habibah, L. N. Ismail, M. Rusop, Wan Haliza Abd Majid, W. C. Gan\",\"doi\":\"10.1109/SHUSER.2012.6268990\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The morphology of PVDF-TrFE (70/30) thin film at various annealing temperature were investigated using non-contact mode Atomic Force Microscopy (AFM). Differential Scanning Calorimetry (DSC) technique was used to obtain T<sub>C</sub>, T<sub>m</sub>, and T<sub>Crys</sub> of PVDF-TrFE. The prepared spin coated PVDF-TrFE (70/30) thin films were annealed at T<sub>C</sub> (113°C), T<sub>m</sub> (154°C), T<sub>Crys</sub> (135°C) and T<sub>c</sub> at cooling (55°C) in accordance to the DSC thermogram observed. Impedance Spectroscopy were conducted to study the dielectric characteristic of the thin films in order to substantiate the electrical behavior of the thin films From the results obtained, the thin films exhibited different morphologies depending on the annealing temperatures utilized. Formation of needle-like crsytallite structure was observed film annealed at and over T<sub>m</sub>. Thin film re-crystallized at T<sub>C</sub> has an optimized dielectric constant of ~7.8 at 10<sup>4</sup> hz.\",\"PeriodicalId\":426671,\"journal\":{\"name\":\"2012 IEEE Symposium on Humanities, Science and Engineering Research\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE Symposium on Humanities, Science and Engineering Research\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SHUSER.2012.6268990\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE Symposium on Humanities, Science and Engineering Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SHUSER.2012.6268990","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effect of various annealing temperature on the morphological and dielectric properties of Polyvinylidenefluoride-Trifluoroethylene thin film
The morphology of PVDF-TrFE (70/30) thin film at various annealing temperature were investigated using non-contact mode Atomic Force Microscopy (AFM). Differential Scanning Calorimetry (DSC) technique was used to obtain TC, Tm, and TCrys of PVDF-TrFE. The prepared spin coated PVDF-TrFE (70/30) thin films were annealed at TC (113°C), Tm (154°C), TCrys (135°C) and Tc at cooling (55°C) in accordance to the DSC thermogram observed. Impedance Spectroscopy were conducted to study the dielectric characteristic of the thin films in order to substantiate the electrical behavior of the thin films From the results obtained, the thin films exhibited different morphologies depending on the annealing temperatures utilized. Formation of needle-like crsytallite structure was observed film annealed at and over Tm. Thin film re-crystallized at TC has an optimized dielectric constant of ~7.8 at 104 hz.
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