磁透镜系统磁滞的电镜实验

P. V. Bree, C. V. Lierop, P.P.J. van den Bosch
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引用次数: 8

摘要

电子显微镜磁透镜系统中的铁磁滞回和耦合动力学影响了系统的稳态误差和过渡时间。为了清楚地了解确切的问题及其在应用中的表达方式,对商用扫描电子显微镜进行了数据采集和快速原型系统的扩展。通过条件实验,量化了磁滞效应对显微应用的意义。通过对同步透镜电流的分析和所得到的图像的估计清晰度来评估响应。在局部操作点得到图像清晰度对输入变化的灵敏度。滞后效应及其与动力学的耦合,作为对整个工作范围变化的响应,会导致图像清晰度的显著偏差。由于磁场不可用于测量,因此误差表示为需要校正的准静态输入变化。为了更好地理解所观察到的效应和磁透镜作为一个系统,采用动力学-滞后-电子光学互连模型对实验结果进行了分析和再现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electron microscopy experiments concerning hysteresis in the magnetic lens system
Ferromagnetic hysteresis and coupled dynamics in the magnetic lens system of electron microscopes degrade the machine's performance in terms of steady-state error and transition time. To get a clear understanding of the exact problem and the way it is expressed in the application a commercial scanning electron microscope is extended with a data-acquisition and rapid proto-typing system. By means of conditioned experiments the significance of the hysteresis effects for microscopy applications is quantified. The response is evaluated by an analysis of synchronized lens currents and estimated sharpness of the resulting images. The sensitivity of image sharpness versus input variation is obtained in a local operating point. The hysteresis effect and its coupling with dynamics, as a response to changes over the complete working range, result in a significant deviation in image sharpness. Since the magnetic field is not available for measurement, the error is expressed in the quasi-static input variation required to correct for it. In order to get a good understanding of the observed effects and the magnetic lens as a system, an interconnected dynamics-hysteresis-electron optics model is used to analyze and to reproduce the experimental results.
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