光敏传感器用过渡和碱金属掺杂MoS2块体层的结构和电子性能分析

R. .. Talwekar, A. Tiwari
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引用次数: 0

摘要

基于DFT计算的第一性原理,研究了过渡金属(TM)原子(Au、Ag和Cu)和碱金属(AM)原子(Na、Li)掺杂对MoS2体层结构和电子性能的影响。分析了五种掺杂方式不同的MoS2体层的态密度、能带结构和结构参数。结果表明,AM原子的掺杂比TM原子的掺杂进一步缩小了MoS2本体层的带隙。Li-MoS2层的带隙最小,为0.609eV,未掺杂的MoS2层的带隙最大,为1.42eV。可以得出结论,在基于MoS2的光电二极管/光电晶体管传感器的应用中,掺杂AM原子可能证明是传统使用的TM (Au)掺杂阵列的有效替代方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Structural and Electronic Property Analysis of Transition and Alkaline Metal Doped MoS2 Bulk Layers for Photo-Sensor Applications
The influence of transition metal (TM) atoms (Au, Ag, and Cu) and alkaline metal (AM) atoms (Na, Li) doping on the structural and electronic properties of MoS2 bulk layers was studied based on the first-principles of DFT calculations. The density of states (DOS), band structures, and structural parameters of five differently doped MoS2 bulk layers were analyzed. The results show that doping of AM atoms further narrows the bandgap of MoS2 bulk layer than the TM doped atoms. The least bandgap of 0.609eV was observed for Li-MoS2 layer whereas the highest bandgap of 1.42eV for undoped MoS2 was recorded. It can be concluded that in applications of MoS2 based photodiode/phototransistor sensors, doping of AM atoms may prove an effective alternative to conventionally used TM (Au) doped arrays.
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