{"title":"磁记录材料的干涉表面计量","authors":"D. M. Perry","doi":"10.1364/oft.1985.thaa3","DOIUrl":null,"url":null,"abstract":"Surface roughness of magnetic recording media has been experimentally and theroetically related to the performance of the media (ref. 1). A computerized three-dimensional interferometer (ref. 2) has become an invaluable aid in the development of current and next generation recording products. Correlations of −0.95 and better are routinely achieved between the measured RMS roughness and magnetic performance measures such as rf output in dB.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Interferometric Surface Metrology of Magnetic Recording Materials\",\"authors\":\"D. M. Perry\",\"doi\":\"10.1364/oft.1985.thaa3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Surface roughness of magnetic recording media has been experimentally and theroetically related to the performance of the media (ref. 1). A computerized three-dimensional interferometer (ref. 2) has become an invaluable aid in the development of current and next generation recording products. Correlations of −0.95 and better are routinely achieved between the measured RMS roughness and magnetic performance measures such as rf output in dB.\",\"PeriodicalId\":142307,\"journal\":{\"name\":\"Optical Fabrication and Testing Workshop\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Fabrication and Testing Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/oft.1985.thaa3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Fabrication and Testing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1985.thaa3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Interferometric Surface Metrology of Magnetic Recording Materials
Surface roughness of magnetic recording media has been experimentally and theroetically related to the performance of the media (ref. 1). A computerized three-dimensional interferometer (ref. 2) has become an invaluable aid in the development of current and next generation recording products. Correlations of −0.95 and better are routinely achieved between the measured RMS roughness and magnetic performance measures such as rf output in dB.
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