{"title":"教学耦合机制——一个案例研究","authors":"M. Albach, H. Rossmanith","doi":"10.1109/ISEMC.2003.1236583","DOIUrl":null,"url":null,"abstract":"An EMC experiment is described, which demonstrates a combination of ohmic, capacitive and inductive coupling. Based on the test set-up, an equivalent circuit is derived, which can be used to analyze and to explain the somewhat unexpected behavior of the test set-up during the different experiments. These experiments are used as part of an EMC course and the procedure of how to understand the underlying effects will be explained in this paper step by step.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Teaching coupling mechanisms - a case study\",\"authors\":\"M. Albach, H. Rossmanith\",\"doi\":\"10.1109/ISEMC.2003.1236583\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An EMC experiment is described, which demonstrates a combination of ohmic, capacitive and inductive coupling. Based on the test set-up, an equivalent circuit is derived, which can be used to analyze and to explain the somewhat unexpected behavior of the test set-up during the different experiments. These experiments are used as part of an EMC course and the procedure of how to understand the underlying effects will be explained in this paper step by step.\",\"PeriodicalId\":359422,\"journal\":{\"name\":\"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2003.1236583\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2003.1236583","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An EMC experiment is described, which demonstrates a combination of ohmic, capacitive and inductive coupling. Based on the test set-up, an equivalent circuit is derived, which can be used to analyze and to explain the somewhat unexpected behavior of the test set-up during the different experiments. These experiments are used as part of an EMC course and the procedure of how to understand the underlying effects will be explained in this paper step by step.