用于高温航空应用的SiC MOSFET栅极氧化物可靠性评估

2013 IEEE ECCE Asia Downunder Pub Date : 2013-06-03 DOI:10.1109/ECCE-ASIA.2013.6579125

T. Santini, Morand Sebastien, Miller Florent, L. Phung, B. Allard

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引用次数: 38

摘要

随着飞机电动化的趋势，碳化硅功率开关可以大量用于飞机内的高温应用。这类电力电子元件的可靠性评估是鉴定过程中的一个关键要素。在这项研究中，我们专注于MOSFET栅极氧化物的可靠性，这是已知的这些组件中更脆弱的部分。

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Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications

With the trend toward more electrical aircraft, Silicon Carbide power switches could be heavily used for high temperatures applications within the aircraft. The assessment of the reliability of such power electronic components is a key element for the qualification process. In this study we focused on the reliability of the MOSFET gate oxide which is known to be the more fragile part of these components.

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2013 IEEE ECCE Asia Downunder

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