电子电路板抗扰度建模

Oussama Alilou, V. Fontaine, C. Marot
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引用次数: 2

摘要

电子电路板将以更低的电源电压成为更高的集成密度。内部集成电路在硅上有越来越多的门,印刷电路板使用了许多高密度技术。尺寸减小与附近信号位置的集成促进了内部串扰,尺寸减小的模具几何形状增加了寄生结构中作为隔离电容的不必要电流。因此,电子电路板的抗扰性变得越来越重要,在设计阶段几乎不需要使用模型和仿真工具来优化磁化率行为,并预测IC和应用层面对传导干扰的抗扰强度。本文在第一节中介绍了集成电路建模的IEC项目概述。第二节描述了电子电路板的抗扰度模型。第三部分给出了驱动总线的实例模型。第四部分给出了使用该驾驶员抗扰度模型进行抗扰度测试的仿真结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Immunity modelling of electronics board
Electronic boards will become higher density of integration with lower supply voltages. Internal integrated Circuits have more and more gates on silicon and Printed circuits Boards use many high density technologies. That size reduction integration with nearby signals positions promotes internal crosstalk, sizes reduction of die geometries increases unwanted current in parasitic structure as isolation capacitances. Consequently, the immunity of electronic boards is becoming more and more critical and the use of models and simulation tools is hardly required to optimize during the design phases the susceptibility behaviour and also to predict the immunity strength to conducted disturbances both at the IC and the application level. This paper introduces in section I an overview of the IEC projects for Integrated Circuit modelling. An immunity model for an electronic board is described in section II. Example model of driver bus is presented in a part III. Simulation results of a immunity test with that driver immunity model is presented in a part IV.
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