通过探测器优化辐射对ASIC芯片的影响

2018 International Conference on Information and Communication Technology Convergence (ICTC) Pub Date : 2018-10-01 DOI:10.1109/ICTC.2018.8539458

Hojong Chang, B. Han, G. Cho, Yongho Kim, Woosook Jeon, Hyunduk Kim

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引用次数: 0

摘要

光子计数检测系统是在入射光子大于噪声时进行逐个计数的直接图像检测方法。因此它不同于传统的辐射图像检测设备。该系统具有低剂量、低能量测量的优点，并且可以制作彩色图像。在这项研究中，我们以CdZnTe半导体作为探测器。利用Geant4仿真优化CdZnTe的厚度，考虑x射线穿过CdZnTe对ROIC电路的影响。

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Optimization of the effect of radiation on ASIC chip through detector

The photon counting detecting system is a direct image detection method that counts one by one when incident photons are larger than noise. So it is differs from conventional radiation image detecting equipment. This system has an advantage of measuring low dose and low energy and also possible to make a colorful image. In this study we were targeting CdZnTe semiconductor as detector. Optimize CdZnTe’s thickness to consider the influence of the X-ray passing through CdZnTe on the ROIC circuit using Geant4 simulation.

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2018 International Conference on Information and Communication Technology Convergence (ICTC)

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